3M IC Test Clip, 18 Way, SOIC

Professional IC test clips with nickel silver alloy contacts in a high grade thermoplastic moulding
Features are wiping action ’duck bill’ contacts for optimum electrical reliability, heavy duty spring for firm uniform contact pressure, and an open nose design that permits probe access directly at the Dual-In-Line (DIP) package pins.
The contact comb fits between DIP package leads to eliminate electrical shorting hazards
The test clips can be used with standard DIP packages up to 14, 16, 20, 24, 28 and 40 pins
Body material High Grade Thermoplastic, Gold plating
Contact Material Nickel Silver Alloy
Operating Temperature -55°C to +165°C
Flammability UL 94 V-0
Current rating 2A